发明名称 |
X=Ray device with adjustable primary beam aperture |
摘要 |
The x-ray device has a detector for the generation of image signals and a beam imaging system (11,12) which forms an image of the aperture (5) opening on an additional radiation-to-electrical transducer (10), to which is connected the evaluation electronics for forming electrical signals corresp. to the aperture opening. The beam from a light source passes via the primary beam aperture to reach the transducer. The light reflected from the primary beam aperture is detected by at least one light sensor.
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申请公布号 |
DE4437969(A1) |
申请公布日期 |
1995.08.10 |
申请号 |
DE19944437969 |
申请日期 |
1994.10.24 |
申请人 |
SIEMENS AG, 80333 MUENCHEN, DE |
发明人 |
WINKELMANN, HELMUT, DIPL.-ING. (FH), 91301 FORCHHEIM, DE |
分类号 |
A61B6/06;G21K1/04;G21K5/10;(IPC1-7):G01N23/04 |
主分类号 |
A61B6/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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