发明名称 X=Ray device with adjustable primary beam aperture
摘要 The x-ray device has a detector for the generation of image signals and a beam imaging system (11,12) which forms an image of the aperture (5) opening on an additional radiation-to-electrical transducer (10), to which is connected the evaluation electronics for forming electrical signals corresp. to the aperture opening. The beam from a light source passes via the primary beam aperture to reach the transducer. The light reflected from the primary beam aperture is detected by at least one light sensor.
申请公布号 DE4437969(A1) 申请公布日期 1995.08.10
申请号 DE19944437969 申请日期 1994.10.24
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 WINKELMANN, HELMUT, DIPL.-ING. (FH), 91301 FORCHHEIM, DE
分类号 A61B6/06;G21K1/04;G21K5/10;(IPC1-7):G01N23/04 主分类号 A61B6/06
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