发明名称 System for the identification of defects in natural and synthetic surfaces
摘要 System for locating defects in natural and synthetic surfaces using pattern-recognition methodology. The defects are marked on the surface by outlining their area of influence. The type of defect is also marked on the skin by means of a suitable symbol which is connected with the degree of gravity of the defect. The defect is digitized and identified in an automated manner, using a two-dimensional optical video camera to acquire an image of the surface. Procedures are then applied with a view to vectorization of the contour of the defect and recognition of the symbol based on its geometrical characteristics. Visual inspection of either natural or synthetic surfaces may successfully be applied in the sectors of hides and tanning, ornamental rocks, cork-bark agglomerates, wood and metallomechanics. The footwear industry is the principal beneficiary of this system.
申请公布号 PT101445(A) 申请公布日期 1995.08.09
申请号 PT19940101445 申请日期 1994.01.19
申请人 INESC-INST. DE ENG.DE SISTEMAS E COMPUTADORES;INETI-INST.NAC.ENGENH.E.TECNOL.INDUSTRIAL;ANTONIO FRANCISCO LIMAS SERAFIM 发明人 ANTONIO FRANCISCO LIMAS SERAFIM;JOSE ANTONIO ALMEIDA DA CRUZ
分类号 B07C5/00;G06F11/00;(IPC1-7):G06F11/00 主分类号 B07C5/00
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