发明名称 Method and apparatus for calibration of a monolithic voltage reference
摘要 A method and apparatus for calibration of errors in a monolithic reference includes a bandgap voltage reference (50) that outputs an untrimmed voltage and a temperature voltage. The untrimmed voltage and temperature voltage are input to a delta-sigma A/D converter (52) which has the output thereof processed through a digital filter (54) to output data on a data bus (58) for storage in an EEPROM (60). The EEPROM (60) is operable in one mode to store temperature history data and, in another mode, to store temperature compensation data. In one mode, temperature compensation parameters are retrieved from the EEPROM (60) and utilized by a multiplier/accumulator circuit (74) to generate compensation factors which are output as a digital word to a DAC (76) for controlling a trim circuit (14). The trim circuit (14) provides a temperature compensation for the output of the bandgap voltage reference (50). The system is operable in a calibration mode to measure temperatures during a burn-in procedure and calculate necessary information to determine compensation factors and store these in the EEPROM ( 60). This temperature data is extracted from the EEPROM (60) and output to a serial I/O port (64), compensation factors determined and then stored back in the EEPROM (60). The delta-sigma A/D converter (52) in the run mode then makes temperature measurements for use by the multiplier/accumulator circuit (74) in determining the appropriate compensation data to extract from the EEPROM (60) to trim the output of the bandgap voltage reference circuit (50).
申请公布号 US5440305(A) 申请公布日期 1995.08.08
申请号 US19920937993 申请日期 1992.08.31
申请人 CRYSTAL SEMICONDUCTOR CORPORATION 发明人 SIGNORE, BRUCE D.;SWANSON, ERIC J.
分类号 G01R1/28;G01K7/01;G01K15/00;G01R35/00;G05F3/30;G12B13/00;H03F1/30;H03M1/10;H03M1/12;(IPC1-7):H03M1/10 主分类号 G01R1/28
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