发明名称 Method for preparation of transmission electron microscope sample material utilizing sheet mesh
摘要 A method for processing sample material for use with transmission electron microscopes utilizes a sheet mesh for supporting the sample material during irradiation processing. The sheet mesh is formed of a metallic sheet material having a single opening provided in a central portion thereof, a circumferential edge portion of the opening is tapered from one side of the sheet mesh through to the other and the ankle of the taper corresponds to the ankle of irradiation. Position determining portions are provided on the sheet mesh to assure reliable positioning of the sample material. Also, the method provides a for preparation of the sample material including a protective layer formed over a membrane layer for allowing adhesion of membrane layers made of materials which would otherwise degrade the adhesion layer during processing.
申请公布号 US5440123(A) 申请公布日期 1995.08.08
申请号 US19930112718 申请日期 1993.08.27
申请人 SONY CORPORATION 发明人 IKEDA, YUJI
分类号 G01N1/36;H01J37/20;(IPC1-7):H01J37/26 主分类号 G01N1/36
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