发明名称 |
METHOD OF PASSIVATING WAFER WITH MULTIPLE QUANTUM WELL STRUCTURE |
摘要 |
<p>PURPOSE: To improve performance and evenness of a GaAs/AlGaAs multi- quantum well infrared ray detectors by forming a multi-quantum wells (superlattice wafer) and performing a hydrogen plasma passivation process with a wafer which has just been grown. CONSTITUTION: With molecular beam epitaxy, a GaAs/AlGaAsQWIP wafer is grown (step 202). Then, the wafer is passivation-processed (step 204) with hydrogen plasma. Then, the wafer is processed in a known process step, to form (step 206) plural infrared ray detecting devices. The passivation step is performed by exposing a wafer which has just been grown to hydrogen plasma at a temperature of 200-250 deg.C. Thus, the performance and evenness of a GaAs/ AlGaAs multi-quantum well infrared ray detector is improved.</p> |
申请公布号 |
JPH07202251(A) |
申请公布日期 |
1995.08.04 |
申请号 |
JP19940323940 |
申请日期 |
1994.12.02 |
申请人 |
AMERICAN TELEPH & TELEGR CO <ATT> |
发明人 |
JIYON ROPATA;RAASU KURISUCHIAN RUUZAA;JIYON UIRIAMU SUTEITO JIYUNIA;BENKATARAMAN SUWAMINAZAN |
分类号 |
G01J1/02;G01J5/02;G01J5/28;H01L21/30;H01L21/314;H01L27/14;H01L27/144;H01L29/06;H01L29/15;H01L29/66;H01L31/0248;H01L31/0352;H01L31/10;H01L31/18;(IPC1-7):H01L31/10;H01L31/024 |
主分类号 |
G01J1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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