发明名称 |
FORMATION OF SEMICONDUCTOR DEVICE AND INTEGRATED CIRCUIT DEVICE |
摘要 |
<p>PURPOSE: To provide a shallow groove separation structure formed by a process having the reduced number of processing processes and heat balance. CONSTITUTION: A groove is packed with the liquid accumulation of an insulating semiconductor oxide, the heat treatment of the accumulated oxide is operated, and a thermal oxide layer 30 of high quality is formed on a boundary face between the accumulated oxide film and a substrate 12. This process applies a separation structure for reducing stresses and charge leakages. When a grinding stop layer 14 is provided on a semiconductor material main body, this structure can be easily made flat. The void of the accumulated oxide and a contaminant can be almost removed by self-aligned accumulation on the groove within the capacity of an opening on resist used for forming the groove.</p> |
申请公布号 |
JPH07201979(A) |
申请公布日期 |
1995.08.04 |
申请号 |
JP19940300507 |
申请日期 |
1994.12.05 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
KIYARORU GARI;RUISU RUU-CHIEN SUU;SEIKI OGURA;JIYOSEFU FURANSHISU SHIEPAADO |
分类号 |
H01L21/76;H01L21/316;H01L21/762;H01L27/08;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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