发明名称 Method of processing an epitaxial wafer of InP or the like.
摘要 Fine processing of InP epitaxial wafers including As, In and P for producing laser diodes, light emitting diodes or photodiodes. The InP epitaxial wafer is selectively covered with striped protection mask films. The wafer is etched by some etchant which forms normal-mesas or mountain-shaped stripes under the masks. Then the wafer is again etched by a gas of thermally dissolved AsCl3 till the stripes have rectangle sections with erect surfaces. Buried layers of InP are grown on the eliminated parts of the wafer. <IMAGE>
申请公布号 EP0665581(A1) 申请公布日期 1995.08.02
申请号 EP19950300040 申请日期 1995.01.04
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 IWASAKI, TAKASHI, C/O OSAKA WORKS OF
分类号 H01L21/302;H01L21/205;H01L21/306;H01L21/308;H01L31/10;H01L31/18;H01L33/00;H01L33/08;H01L33/14;H01L33/20;H01L33/30;H01S5/00;H01S5/20;H01S5/22;H01S5/227;H01S5/323 主分类号 H01L21/302
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