发明名称 TEST DEVICE OF ELECTRIC ELEMENT
摘要 PURPOSE: To form an excellent contact between a lead of an electronic element and a testing fixed tool contact and lessen the cost of testing a packaged electronic element by connecting the contact point of the testing fixed tool with a compressive part having a continuous surface. CONSTITUTION: A mounting block 40 supports a plurality of conductive lines 42. The conductive lines 42 are coaxial conductors with 50Ωconnected with a rectangular flange 43. The flange 43 is placed in the center conductor 31 of the conductive routes 42 and an insulating sleeve is placed in a route of a mounting block 40. Shield conductors of the conductor lines 42 are connected with the block 40 and the block 40 works as a shield for parts of the conductor lines 42 placed in the route. A compressive part such as a bellows 40 is mechanically and electrically connected with the end of the center conductor 31 of the coaxial conductors. The compressive part compensates the geometric and physical tolerance difference caused in the manufacturing process.
申请公布号 JPH07198778(A) 申请公布日期 1995.08.01
申请号 JP19920246031 申请日期 1992.08.24
申请人 AMERICAN TELEPH & TELEGR CO <ATT> 发明人 JIYOSEFU EE MESHIINA
分类号 G01R31/26;G01R1/073;G01R31/00;H01L21/66;H01R33/76;(IPC1-7):G01R31/26 主分类号 G01R31/26
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