| 摘要 |
PURPOSE:To measure the magnetic polarential degree of elements contained in a very small area and the spin polarential degree of an electron beam by obtaining the intensity of a characteristic X-ray generated by radiating a spin polarized electron beam spin-polarized in a certain direction and in the reverse direction to a sample. CONSTITUTION:A photoelectron generating source A generates a spin polarized electron beam K spin-polarized in a certain direction and in the reverse direction, the beam is accelerated and focused by an electrostatic lens B to apply a spin polarized electron beam K to a sample D, and an arbitrary sample D is irradiated by a deflector C. A characteristic X-ray radiated from the part is detected by an X-ray detector E, a detection signal is measured by a measurement control device G, and its intensity is obtained to calculate the magnetic polarential degree. At this time, spin polarization in a certain direction and in the reverse direction is made parallel and reverse to the spin direction of a magnetic atom of a sample D, and the intensity of a characteristic X-ray at that time is detected to calculate the magnetic polarential degree. |
