发明名称 Multiple filament enhanced ion source
摘要 An improved ion source is provided with multiple filaments and wiring for selectively connecting various combinations of filaments to a current source. In one embodiment an additional filament is a spare filament which is connected to the current source when the primary filament burns out. This decreases down time due to filament replacement. In another embodiment, an additional filament operates simultaneously with a primary filament to provide a more homogenous electron cloud and to increase filament life.
申请公布号 US5438238(A) 申请公布日期 1995.08.01
申请号 US19930035337 申请日期 1993.03.19
申请人 NEC ELECTRONICS INC. 发明人 TOY, STEPHEN W.;ALEXANDER, DAVID V.
分类号 H01J27/20;(IPC1-7):H01J7/24 主分类号 H01J27/20
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