发明名称 |
X-ray analysis apparatus and scanning unit suitable for use in such an apparatus |
摘要 |
An X-ray analysis apparatus includes a scanning unit (1) with an X-ray source (3), a crystal holder (9) and an X-ray detection system (5) provided with an X-ray detector (7). The crystal holer (9) can be rectilinearly displaced in a fixed radiation pick-up direction (35) relative to the X-ray source (3). The crystal holder (9) and the X-ray detector (7) are mechanically coupled to one another via a plate (21) which can be driven by means of a motion mechanism. The X-ray source (3), the X-ray detector (7) and the crystal holder (9) remain positioned on a Rowland circle (11) during the displacement. The motion mechanism has a first guide (23) and a second guide (25). The drive direction of the first guide (23) encloses an acute angle alpha relative to the fixed pick-up direction (35).
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申请公布号 |
US5438613(A) |
申请公布日期 |
1995.08.01 |
申请号 |
US19920993342 |
申请日期 |
1992.12.18 |
申请人 |
U.S. PHILIPS CORPORATION |
发明人 |
GIJZEN, WILHELMUS A. H.;VAN EGERAAT, WALTERUS A. L. A.;VAN ALEN, JOHANNES P. M.;VISSCHER, ALBERT |
分类号 |
G01N23/20;G01N23/207;G01N23/22;G01N23/223;G01N23/225;G21K1/06;(IPC1-7):G01T1/36 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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