| 摘要 |
PURPOSE:To provide an image processor where the speed up of the pattern matching of a reference image and an image to be inspected is performed and detection capacity and detection accuracy are improved even at an image of the lowest matching degree. CONSTITUTION:By a run length code generation circuit 3, a run length code is generated from the binary image of a reference image and an image to be inspected. By an image moving means 8, the run length code of the reference image is made to match with the run length code of the image to be inspected. After the matching, an AND calculation of a registered image and the image to be inspected is performed by an AND means 9. By an area measurement means 10, the reference image, the image to be inspected and the area of the result of the AND calculation are measured. From the area measured by the area measurement means 10, a normalization correlation is determined by a correlation arithmetic means 11. By an image moving means 8, the reference image is moved all over the areas of the image to be inspected. With the normalization correlation showing a maximum value, a pattern matching is completed. |
