发明名称 ELECTRODE STRUCTURE AND ITS MANUFACTURE
摘要 PURPOSE:To obtain a good ohmic contact to a p-type ZnxMgyCd1-x-ySzSe1-z semiconductor by forming an ohmic contact layer havmng an alloy layer which includes either Cd or Hg between the semiconductor layer and an electrode metal layer. CONSTITUTION:On a p-type ZnxMgyCd1-x-ySzSe1-z (0<=x, y, z<=1, x+y<=1) semiconductor l, metal Cd is deposited in the thickness of 50nm by vacuum evaporation or other method. Then, the semiconductor l 19 heat-treated at 300 deg.C for 10 minutes in a nitrogen atmosphere. By this heat treatment, the diffusion occurs between the semiconductor 1 and the metal Cd and thereby an allay layer in correspondence with a composition ratio of 'x' is formed. Nextly, Au is vacuum-evaporated on this ohmic contact layer 2 to form Au electrodes 3. By this method, a good ohmic contact to the p-type ZnxMgyCd1-x-ySzSe1-z (0<=x, y, z<=, x+y<=1) semiconductor l, which has been difficult to materialize in the conventional method, can be obtained easily without giving a bad effect on a light emitting device.
申请公布号 JPH07193216(A) 申请公布日期 1995.07.28
申请号 JP19930333765 申请日期 1993.12.27
申请人 SHARP CORP 发明人 TERAGUCHI NOBUAKI;OKUMURA TOSHIYUKI
分类号 H01L29/43;H01L21/28;H01L33/28;H01L33/40 主分类号 H01L29/43
代理机构 代理人
主权项
地址
您可能感兴趣的专利