| 摘要 |
PURPOSE:To provide the overlap image discriminating device which finds not only an overlap part but also an overlap area including significant picture elements connected to this part to considerably improve the cause investigation work of defect inspection or the like. CONSTITUTION:Picture element values of corresponding picture elements of binary pictures A and B are added by an adder 1 to generate an addition image 2, and different labels are given to independent areas, which consist of plural significant picture elements which exist in the addition image 2 and are adjacently connected, by a labeling device 3, and a maximum value of picture element values of picture elements belonging to each area to which the label is given is obtained by a maximum value discriminator 4, and the area whose maximum value is equal to or larger than 2 is discriminated as an overlap by overlap discriminating device 5. |
