发明名称 POWER SUPPLY CONTROL TESTER
摘要 PURPOSE:To protect a device (FET) against breakdown by receiving interruption signals from a plurality of FET interruption control circuits and delivering outputs to other FET interruption control circuits. CONSTITUTION:Overvoltage state of one power supply 1 among a plurality of power supplies 1-3 is detected by a detection circuit 1 which delivers a detection signal 1 to an FET interruption control circuit 4 for interrupting power supply to an FET 10 by delivering an interruption signal 1. The interruption signal 1 is also received by a photocoupler 17 which delivers an output to other FET interruption control circuit 5 producing an interruption signal 2. A photocoupler 18 receiving the interruption signal 1 delivers an output to an FET interruption control circuit 6 producing an interruption signal 3. Consequently, power supply 2, 3 for the FETs 11, 12 is interrupted and each device, i.e., FET 10, 11, 12, is protected against breakdown.
申请公布号 JPH07193996(A) 申请公布日期 1995.07.28
申请号 JP19930329180 申请日期 1993.12.27
申请人 FUJITSU LTD 发明人 ABE HIROAKI
分类号 H02J9/00;H02J1/00 主分类号 H02J9/00
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