发明名称 TRANSISTOR AND ITS MAKING METHOD
摘要 The method prevents some degradations such as puchthrough from occuring by making the lengh of gate longer than that of effective channel. The method comprises the steps of: forming source and draing regions on the semiconductor substrate; forming a channel region whose surface is uneven between the source region and the draing region; and forming a gate by removing the photoresist insulating layer on the channel regions.
申请公布号 KR950008258(B1) 申请公布日期 1995.07.26
申请号 KR19920023432 申请日期 1992.12.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YUN, JU - YONG
分类号 H01L21/336;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/336
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