发明名称 |
Non-contacting capacitance probe for dielectric cure monitoring |
摘要 |
Conductive measuring electrodes, of a capacitive probe having a grounded guard electrode positioned therebetween shield a probe circuit, provides mutual capacitance measurements which way as a function of changes in impedance of dielectric material being monitored as it undergoes a curing process. The probe is positioned in non-embedded relation to the dielectric material to form a sensitivity region therein through which an electric field extends between the conductive measuring electrodes of the probe to establish said variable mutual capacitance measurements without extraneous influences.
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申请公布号 |
US5436565(A) |
申请公布日期 |
1995.07.25 |
申请号 |
US19920944602 |
申请日期 |
1992.09.14 |
申请人 |
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY |
发明人 |
GAMMELL, PAUL M. |
分类号 |
G01N27/22;(IPC1-7):G01R27/26 |
主分类号 |
G01N27/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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