发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PURPOSE:To provide a semiconductor device which shows rapid performance even when the pattem is made finer by forming gate electrode and a first conductivity type source/drain region in a semiconductor substrate, by forming a first conductivity type semiconductor film into a cone shape in the region and by forming an electrode wiring on the semiconductor film through compound of the semiconductor film. CONSTITUTION:A silicon film 17 of the same conductivity as a source/drain region 15 is formed inside a source/drain region of a MOSFET provided with a gate electrode 14 and a source/drain region 15 in a semiconductor substrate 11. As for a method for forming the N-type silicon film 17 into a cone shape, for example, polycrystalline silicon is epitaxially formed selectively inside a contact hole, and then, the N-type silicon film 17 is formed by ion implantation. An aluminum film 21 is provide on the silicon film 17 through a titanium silicide film 20. A MOSFET is completed by patterning the aluminum film 21.
申请公布号 JPH07183486(A) 申请公布日期 1995.07.21
申请号 JP19930327322 申请日期 1993.12.24
申请人 TOSHIBA CORP 发明人 IWASE MASAO;MIZUNO TOMOHISA
分类号 H01L29/41;H01L21/768;H01L23/522;H01L29/78;(IPC1-7):H01L29/41 主分类号 H01L29/41
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