OPEN CIRCUIT DETECTOR AND THERMOCOUPLE TESTING METHOD,申请号JP19940192038-传众专利搜索

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发明名称	OPEN CIRCUIT DETECTOR AND THERMOCOUPLE TESTING METHOD
摘要
申请公布号	JPH07174642(A)	申请公布日期	1995.07.14
申请号	JP19940192038	申请日期	1994.07.22
申请人	FURUUKU CORP	发明人	SUTEIIBUN DEII SUIFUTO
分类号	G01P15/00;G01D21/00;G01K7/02;G01R31/00;G01R31/02;G08C25/00;(IPC1-7):G01K7/02	主分类号	G01P15/00
代理机构		代理人
主权项
地址

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