ELEMENT TESTING METHOD,申请号JP19930344678-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	ELEMENT TESTING METHOD
摘要
申请公布号	JPH07174813(A)	申请公布日期	1995.07.14
申请号	JP19930344678	申请日期	1993.12.21
申请人	SONY TEKTRONIX CORP	发明人	KATO KATSUHISA;ONOZAWA TOSHIHIKO;EBISAWA AKIRA;USUDA KOICHI
分类号	G01R31/26;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

您可能感兴趣的专利

SWITCH-TYPE RECTIFIED VOLTAGE STABILIZER

DEVICE FOR CORONA ELECTRIZATION OF PHOTOSENSITIVE LAYER

DEVICE FOR STABILIZING AND MEASURING RESIDUAL MAGNETIZATION OF PERMANENT MAGNETS

METHOD OF DETERMINING COPPER QUALITY

DEVICE FOR FATIGUE TESTING OF WHEEL PAIR AXES

METHOD OF FATIGUE TESTING OF MATERIALS

THREE DEGREE-OF-FREEDOM GYROSCOPE ARRESTING DEVICE

STRAIN-GAUGE FOR MEASURING LONGITUDINAL DEFORMATIONS OF SPECIMEN

ROTATION-STABILISED HUNTING GUN BULLET

PULSE COUNTING DEVICE

DEVICE FOR DETERMINING TEXTILE MATERIAL CREASING PROPERTY

DEVICE FOR INTRODUCING SAMPLE INTO CHROMATOGRAPHIC COLUMN

SYSTEM FOR ANALYTIC INVESTIGATING OF LIQUID SAMPLES

LIQUID METERING APPARATUS

APPARATUS FOR PRODUCING INDUCTION MELTING FURNACE DOUBLE-LAYER CRUCIBLES

APPARATUS FOR CONTROLLING CHARGING OF FURNACE FOR HEATING WORKPIECIES

RECIRCULATION RADIATION PIPE

ILLUMINATION APPARATUS DIFFUSOR

APPARATUS FOR DRYING EXPLOSION WELLS