发明名称 High density plasma CVD and etching reactor.
摘要 The disclosure relates to an RF inductively coupled plasma reactor including a vacuum chamber (102) for processing a wafer (82), one or more gas sources (98, 100) for introducing into the chamber reactant gases, and an antenna (80) capable of radiating RF energy into the chamber to generate a plasma therein by inductive coupling, the antenna lying in a two-dimensionally curved surface. In another embodiment a plasma reactor includes apparatus for spaying a reactant gas at a supersonic velocity toward the portion of the chamber overlying the wafer. In a further embodiment a plasma reactor includes a planar spray showerhead for spraying a reactant gas into the portion of the chamber overlying the wafer with plural spray nozzle openings facing the wafer, and plural magnets in an interior portion of the planar spray nozzle between adjacent ones of the plural nozzle openings, the plural magnets being oriented so as to repel ions from the spray nozzle openings. <IMAGE>
申请公布号 EP0641013(A3) 申请公布日期 1995.07.12
申请号 EP19940305090 申请日期 1994.07.12
申请人 APPLIED MATERIALS INC 发明人 FAIRBAIRN KEVIN;NOWAK ROMUALD
分类号 C23C14/34;C23F4/00;H01J37/32;H01L21/205;H01L21/302;H01L21/3065;H05H1/46 主分类号 C23C14/34
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