发明名称 |
Fine particle analyzing device |
摘要 |
A device for analyzing fine particles in a sample gas includes a light source for emitting light, a convergent device for converting the light emitted by the light source into a convergent light beam having a light focus point and an energy density sufficient to dissociate the fine particles to be analyzed. The device also includes a transparent analyzer tube having a window for admitting the convergent light beam and a throat located at the light focus point of the convergent light beam, the analyzer tube receiving the sample gas and passing the sample gas through the throat. The device includes a light collecting device for collecting, through the analyzer tube, light emitted from dissociated fine particles, dissociated by the convergent light beam in the throat of the analyzer tube, and an analyzing device for analyzing the light from the dissociated fine particles collected by the collecting device.
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申请公布号 |
US5432601(A) |
申请公布日期 |
1995.07.11 |
申请号 |
US19930167086 |
申请日期 |
1993.12.16 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
TANAKA, HIROSHI;OHMORI, MASASHI |
分类号 |
G01N15/02;G01N15/10;G01N15/14;G01N21/71;(IPC1-7):G01N1/10 |
主分类号 |
G01N15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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