发明名称 Apparatus for and method of measuring geometric, positional and kinematic parameters of a rotating device having a plurality of interval markers
摘要 A system and method of measuring geometric, positional and kinematic parameters of a rotating device is described. The system includes a plurality of spaced interval markings distributed about the periphery of a rotatable device, such as a disk, around a circle of known radius concentric with a geometrical center of the disk. At least three and preferably four sensors for detecting the markings are positioned to sense the markings as they rotate with the rotatable device. The sensors are angularly spaced relative to one another around the disk. Means are also provided for interpolating locations between selected markers by measuring the time since each sensor senses a marker. A reference marker is provided so as to establish a reference point of the rotatable device relative to a fixed point relative to the sensors. Circuitry is provided for determining any lateral displacement of the geometric center of the rotatable device, any out-of roundness of the rotatable device if desired, the angular position of the rotatable device relative to the fixed point relative to the sensors, and the angular velocity of the rotatable device during its rotation. The apparatus has particular application to X-ray tomography systems.
申请公布号 US5432339(A) 申请公布日期 1995.07.11
申请号 US19940338263 申请日期 1994.11.10
申请人 ANALOGIC CORPORATION 发明人 GORDON, BERNARD M.;ABRAHAM, DOUGLAS;WINSTON, DAVID;WAGONER, PAUL
分类号 G01B21/22;A61B6/03;G01D5/244;G01D5/245;(IPC1-7):G01D5/34 主分类号 G01B21/22
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