发明名称 |
Collimation hardware with RF bias rings to enhance sputter and/or substrate cavity ion generation efficiency |
摘要 |
A plasma deposition system for sputter depositing material from a target onto a wafer, the system including a vacuum chamber; a platform for holding the wafer during plasma processing; a source onto which the target is mounted and for generating a plasma in the chamber during operation; an equipotential conductive plane dividing the chamber into an upper cavity in which the target is located and a lower cavity in which the wafer is located, the equipotential conductive plane permitting material sputtered from the target to pass therethrough; and an upper antenna located inside the upper cavity and surrounding the plasma, the upper antenna for coupling RF power into the source-generated plasma.
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申请公布号 |
US5431799(A) |
申请公布日期 |
1995.07.11 |
申请号 |
US19930145744 |
申请日期 |
1993.10.29 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
MOSELY, RODERICK C.;RAAIJMAKERS, IVO J.;HANAWA, HIROJI |
分类号 |
C23C14/34;H01J37/34;H01L21/203;(IPC1-7):C23C14/34 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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