发明名称 Collimation hardware with RF bias rings to enhance sputter and/or substrate cavity ion generation efficiency
摘要 A plasma deposition system for sputter depositing material from a target onto a wafer, the system including a vacuum chamber; a platform for holding the wafer during plasma processing; a source onto which the target is mounted and for generating a plasma in the chamber during operation; an equipotential conductive plane dividing the chamber into an upper cavity in which the target is located and a lower cavity in which the wafer is located, the equipotential conductive plane permitting material sputtered from the target to pass therethrough; and an upper antenna located inside the upper cavity and surrounding the plasma, the upper antenna for coupling RF power into the source-generated plasma.
申请公布号 US5431799(A) 申请公布日期 1995.07.11
申请号 US19930145744 申请日期 1993.10.29
申请人 APPLIED MATERIALS, INC. 发明人 MOSELY, RODERICK C.;RAAIJMAKERS, IVO J.;HANAWA, HIROJI
分类号 C23C14/34;H01J37/34;H01L21/203;(IPC1-7):C23C14/34 主分类号 C23C14/34
代理机构 代理人
主权项
地址