发明名称 Method for constructing semiconductor-on-insulator
摘要 A method for constructing a semiconductor-on-insulator is provided. A sacrificial layer (12) of a predetermined thickness is first formed on a semiconductor wafer (10) surface. The wafer (10) is then subjected to an ion implantation process to place the ions (16) at predetermined depths below the semiconductor wafer surface. During the implantation process, the sacrificial layer (12) is gradually sputtered away and thereby compensating the gradual outgrowth of the silicon surface due to the volume of the implanted ions (16). A post-implant anneal is performed to allow the ions (16) to react with the semiconductor to form a buried insulating layer (24).
申请公布号 US5429955(A) 申请公布日期 1995.07.04
申请号 US19920966236 申请日期 1992.10.26
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 JOYNER, KEITH A.;EL-GHOR, MOHAMED K.;HOSACK, HAROLD H.
分类号 H01L21/02;H01L21/265;H01L21/76;H01L21/762;H01L27/00;H01L27/12;(IPC1-7):H01L21/265 主分类号 H01L21/02
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