发明名称 |
Element analyzing method |
摘要 |
Element identification and concentration calculation can be conducted with precision by correcting waveform distortion caused by the energy resolution of a detection system. A smoothing process is effected on a measured waveform of fluorescent X-rays obtained from an object to be measured. A device function of the detection system is obtained for each analytic element, based on the energy resolution of the detection system for a fluorescent X-ray energy value of each analytic element. A deconvolution process is effected on the measured waveform thus smoothed, by using the device functions of the detection system. Analytic elements are identified and concentrations of the analytic elements are obtained from the waveform data after the deconvolution process. The measured waveform is compensated for absorption in a beryllium window prior to smoothing.
|
申请公布号 |
US5430786(A) |
申请公布日期 |
1995.07.04 |
申请号 |
US19930161270 |
申请日期 |
1993.12.03 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KOMATSU, FUMIO;MIYAZAKI, KUNIHIRO;SHIMAZAKI, AYAKO |
分类号 |
G01N23/223;G01N23/225;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|