发明名称 |
MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PURPOSE:To provide a dry etching technique by which films of a metal having a high melting point, such as tungsten, etc., can be machined with high dimensional accuracy. CONSTITUTION:At the time of dry-etching a W film 29 deposited on a semiconductor substrate 1 by using an etching gas containing a fluorine gas, the shape of the pattern is controlled by providing a Ti film 28 underneath the film 29 in advance and depositing a TiF layer 31 produced under a low vapor pressure as a result of the reaction between the fluorine and Ti film 28 on the side wall of the pattern. |
申请公布号 |
JPH07169744(A) |
申请公布日期 |
1995.07.04 |
申请号 |
JP19930314838 |
申请日期 |
1993.12.15 |
申请人 |
HITACHI LTD;TEXAS INSTR JAPAN LTD |
发明人 |
TORII ZENZO;OHIRA YOSHIKAZU;NISHIMURA MICHIO;MATSUI TAKESHI |
分类号 |
H01L21/302;H01L21/3065;H01L21/8242;H01L27/10;H01L27/108 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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