发明名称 MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To provide a dry etching technique by which films of a metal having a high melting point, such as tungsten, etc., can be machined with high dimensional accuracy. CONSTITUTION:At the time of dry-etching a W film 29 deposited on a semiconductor substrate 1 by using an etching gas containing a fluorine gas, the shape of the pattern is controlled by providing a Ti film 28 underneath the film 29 in advance and depositing a TiF layer 31 produced under a low vapor pressure as a result of the reaction between the fluorine and Ti film 28 on the side wall of the pattern.
申请公布号 JPH07169744(A) 申请公布日期 1995.07.04
申请号 JP19930314838 申请日期 1993.12.15
申请人 HITACHI LTD;TEXAS INSTR JAPAN LTD 发明人 TORII ZENZO;OHIRA YOSHIKAZU;NISHIMURA MICHIO;MATSUI TAKESHI
分类号 H01L21/302;H01L21/3065;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L21/302
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