发明名称 Semiconductor device having capacitor and manufacturing method thereof.
摘要 A semiconductor device forming a capacitor through an interlayer insulating layer on a semiconductor substrate on which an integrated circuit is formed. This semiconductor device has an interlayer insulating layer with moisture content of 0.5 g/cm<3> or less, which covers the capacitor in one aspect, and has a passivation layer with hydrogen content of 10<2><1> atoms/cm<3> or less, which covers the interconnections of the capacitor in other aspect. By thus constituting, deterioration of the capacitor dielectric can be prevented which brings about the electrical reliability of the ferroelectric layer or high dielectric layer. <IMAGE>
申请公布号 EP0642167(A3) 申请公布日期 1995.06.28
申请号 EP19940112106 申请日期 1994.08.03
申请人 MATSUSHITA ELECTRONICS CORP 发明人 ARITA KOJI;FUJII EIJI;SHIMADA YASUHIRO;UEMOTO YASUHIRO;INOUE ATSUO;NASU TORU;MATSUDA AKIHIRO;NAGANO YOSHIHISA;MATSUURA TAKETOSHI;OTSUKI TATSUO
分类号 H01L21/02;H01L21/8242;H01L21/8246;H01L27/115 主分类号 H01L21/02
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