| 摘要 |
A three-dimensional measuring apparatus comprises a multi-slit projector (101) for projecting a coded multi-slit light pattern onto an object to be measured and an image recognizing apparatus. The image recognising appartus comprises an image pick up unit (102) for picking up said coded multi-slit light pattern projected on said object, a binarization circuit (103) for binarizing image signals from said image pick up unit (102), an image arithmetic unit (105) for changing, each time said coded multi-slit light pattern is changed, weights assigned to the binarized image signals obtained by said binarization circuit (103), and for summing up the last weighted binarized image signals or the image signals of the last added results read out from an image memory (104), with newly weighted binarized image signals, a coded pattern irradiated point memory (106) for storing a coordinate of a coded pattern irradiated point of said object, said coordinate corresponding to said multi-slit light which is decoded from the final arithmetic results of said image arithmetic unit (105), and a distance calculating unit (107) for calculating a three-dimensional position of said coded pattern irradiated point of said object, based on the coordinates of the coded pattern irradiated points stored in said coded pattern irradiated point memory (106). <IMAGE> |
