发明名称 |
Rotation rate sensor with built in test circuit |
摘要 |
A rotation rate sensor which employs a built-in (i.e. internal) test circuit. The rotation rate sensor includes a piezoelectric structure. Deposited on the piezoelectric structure are at least two pickup high and two pickup low electrodes. A pickup circuit is coupled to the pickup high and pickup low electrodes. During a normal mode of operation, the piezoelectric structure is subject to a rotation about one of its axis. In response, the pickup circuit generates a rate signal which corresponds to the rotation rate of the piezoelectric structure. The test circuit is coupled to the pickup low electrodes. During a test mode of operation, the piezoelectric structure is also subject to a rotation about the axis. But, the test circuit generates at the same time a test signal which is provided to the pickup low electrodes and which corresponds to a pseudo rate of rotation. In response, the pickup circuit generates a rate signal which corresponds to the sum of the actual rate of rotation of the piezoelectric material plus the pseudo rate of rotation.
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申请公布号 |
US5426970(A) |
申请公布日期 |
1995.06.27 |
申请号 |
US19930100759 |
申请日期 |
1993.08.02 |
申请人 |
NEW SD, INC. |
发明人 |
FLORIDA, ALVIN V.;GUPTA, PIYUSH K.;MACY, DAVID F.;MORRIS, HAROLD D. |
分类号 |
G01C19/02;G01C19/56;G01P9/04;G01P21/00;(IPC1-7):G01P15/09;H01L41/107 |
主分类号 |
G01C19/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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