发明名称 |
Testing architecture with independent scan paths |
摘要 |
A scan test architecture includes first and second serial scan paths for transferring test data to and from an integrated circuit's logic. A first clock controls transfer of information on the first scan path and a second clock controls transfer of data on the second scan path. The first and second clocks are alternately enabled by a control signal initiated under program control of the external test system. |
申请公布号 |
US5428622(A) |
申请公布日期 |
1995.06.27 |
申请号 |
US19930027036 |
申请日期 |
1993.03.05 |
申请人 |
CYRIX CORPORATION |
发明人 |
KUBAN, JOHN R.;MAHER, III, ROBERT D. |
分类号 |
G01R31/3185;(IPC1-7):G01R31/317;G06F11/22 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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