发明名称 |
Precision integrated resistors |
摘要 |
Pin electronics for an IC tester are built as an integrated circuit for characterizing the electrical operation of a device under test (DUT) by applying a test voltage to each of the pins on the DUT and measuring each resulting current. Typically, an IC tester selects one of several measure resistors, applies a stimulus to a pin of the DUT using an input driver, and measures the current response of the DUT through the related measure resistor. Each measure resistor corresponds to a specific current range and measurement accuracy is proportional to the precision of the selected resistor. Each measure resistor is a series of precision integrated resistors having a very low leakage current. This provides for current measurements of high sensitivity.
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申请公布号 |
US5428297(A) |
申请公布日期 |
1995.06.27 |
申请号 |
US19930077189 |
申请日期 |
1993.06.15 |
申请人 |
GRACE, JAMES W.;DIPIETRO, DAVID M. |
发明人 |
GRACE, JAMES W.;DIPIETRO, DAVID M. |
分类号 |
G01R1/20;G01R31/28;G01R31/319;(IPC1-7):G01R1/04 |
主分类号 |
G01R1/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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