发明名称 Precision integrated resistors
摘要 Pin electronics for an IC tester are built as an integrated circuit for characterizing the electrical operation of a device under test (DUT) by applying a test voltage to each of the pins on the DUT and measuring each resulting current. Typically, an IC tester selects one of several measure resistors, applies a stimulus to a pin of the DUT using an input driver, and measures the current response of the DUT through the related measure resistor. Each measure resistor corresponds to a specific current range and measurement accuracy is proportional to the precision of the selected resistor. Each measure resistor is a series of precision integrated resistors having a very low leakage current. This provides for current measurements of high sensitivity.
申请公布号 US5428297(A) 申请公布日期 1995.06.27
申请号 US19930077189 申请日期 1993.06.15
申请人 GRACE, JAMES W.;DIPIETRO, DAVID M. 发明人 GRACE, JAMES W.;DIPIETRO, DAVID M.
分类号 G01R1/20;G01R31/28;G01R31/319;(IPC1-7):G01R1/04 主分类号 G01R1/20
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