发明名称 MEMORY FAULT DETECTION SYSTEM IN ATM CELL TEMPORARY STORAGE DEVICE
摘要 PURPOSE:To detect a fault of a memory storing a cell without addition of redundant data. CONSTITUTION:A cell validity discrimination section 1 detects an invalid and undefined ATM cell to be received and a cell write/read section 2 applies write/ read the ATM cell to/from a memory. A memory test control section 3 writes/ reads the test data for detecting a fault of a memory area not in use to conduct a memory normality test when the received ATM is an invalid and undefined cell to provide a memory fault signal, and a memory control section 4 controls the access of the write/read control section 2 and the memory test control section 3 to the memory. When the invalid and undefined cell is received, a memory area not in use is tested to detect a fault of the memory.
申请公布号 JPH07162439(A) 申请公布日期 1995.06.23
申请号 JP19930329597 申请日期 1993.12.02
申请人 NEC CORP 发明人 NAKAGAWA TATSUO
分类号 H04L13/08;H04L12/28;H04L29/14;H04Q3/00;(IPC1-7):H04L12/28 主分类号 H04L13/08
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