发明名称 MANUFACTURE OF NONVOLATILE SEMICONDUCTOR MEMORY CELL
摘要 PURPOSE: To improve the degree of integration and to prevent the occurrence of excessive erasure by forming an EEPROM of a contactless virtual ground cell as a split gate structure. CONSTITUTION: A field oxide film 11 for preventing the occurrence of punch through between cells of a cell array is formed as island shape at a specified part of the array. A specified photoresist pattern 12 is ion-implanted as a mask to form an imbedded n<+> -bit line 13 in the region between adjoining field oxide film islands 11. After an oxide film 14 has been selectively formed only on the imbedded n<+> -bit line 13, a first gate oxide film 15 is formed at a specified part in a channel region. After a conductive layer has been formed over the entire surface, patterning is performed, and a floating gate line 16 is formed on the upper part of the first gate insulating film 15 in the channel region and at a part of the oxide film 14 on the embedded bet line 13. Thus a split gate structure is obtained for preventing the occurrence of excessive erasure.
申请公布号 JPH07161847(A) 申请公布日期 1995.06.23
申请号 JP19930280764 申请日期 1993.10.15
申请人 GOLD STAR ELECTRON CO LTD 发明人 GUN HIYON PAKU
分类号 H01L21/8242;H01L21/8247;H01L27/10;H01L27/108;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8242
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