发明名称 PHOTOMASK AND PRODUCTION THEREOF
摘要 PURPOSE:To provide a photomask and its production technique easy to produce and correct. CONSTITUTION:The photomask as a mask pattern 2 and an SOG film 3 formed on the surface of a glass substrate 1. The SOG film 3 consists of a material having smaller light transmittance than that of the glass substrate 1. By controlling the thickness of the SOG film 3, a light quantity transmitting through the SOG film 3 is controlled. Thereby, the correction of the photomask is made easy by controlling the film thickness of the SOG film 3 formed in contact with the area where the SOG film 3 is not formed to be the desired dimension of a pattern. Thus, a photomask having desired high accuracy is obtd.
申请公布号 JPH07159975(A) 申请公布日期 1995.06.23
申请号 JP19930307869 申请日期 1993.12.08
申请人 HITACHI LTD 发明人 ICHIKAWA MASARU
分类号 G03F1/58;H01L21/027 主分类号 G03F1/58
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