发明名称 APPARATUS FOR HEATING OR COOLING WAFERS
摘要 Gas-loaded thermal conditioning is used to cause the temperature of a substrate (20) to approach that of a high thermal inertia temperature-controlled plate (22 or 106) by adjustable pressure of gas above the substrate (20), so as to press the substrate (20) against the plate (22 or 106). There is no mechanical contact with the substrate (20) except the plate (22 or 106) which it rests on, and there is no danger of overheating or overcooling.
申请公布号 WO9516800(A1) 申请公布日期 1995.06.22
申请号 WO1994US14399 申请日期 1994.12.15
申请人 BROOKS AUTOMATION, INC. 发明人 HENDRICKSON, RUTH, ANN;HOFMEISTER, CHRISTOPHER;MUKA, RICHARD, S.
分类号 C23C16/458;C23C16/46;C23F1/08;C23F4/00;C30B25/10;C30B31/12;H01L21/00;H01L21/324;H01L21/683;(IPC1-7):C23C16/00;C23F1/02 主分类号 C23C16/458
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