发明名称 AUTOMATIC TICKET EXAMINING METHOD
摘要 <p>PURPOSE:To sufficiently test a ticket examining process right before the ticket examining process is changed by performing the ticket examining process on the basis of new ticket examining process data stored in a 2nd storage means when as a specific medium is used. CONSTITUTION:Once a train medium 27 or the specific card 28 is inserted into an automatic ticket examination machine 10, a ticket (card) process part 24 reads out data recorded on the medium 27 or 28 to decide the train medium 27 or specific card 28, and performs the ticket examining process on the basis of current ticket examining process data stored in a 1st storage area 26a of a RAM 23 when deciding the train medium 27 or on the basis of new ticket examining process data stored in a 2nd storage area 26b of the RAM 23 when deciding the specific card 28. The new ticket examining process data can be checked by using the specific card 28, so the new ticket examining process data which are altered can be checked and tested sufficiently with a margin in advance in a current operation state.</p>
申请公布号 JPH07152934(A) 申请公布日期 1995.06.16
申请号 JP19930321346 申请日期 1993.11.27
申请人 OMRON CORP 发明人 KUWATA TATSUYA
分类号 G06Q50/00;G06Q50/30;G07B15/00;(IPC1-7):G07B15/00;G06F17/60 主分类号 G06Q50/00
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