发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EXAMINATION DEVICE |
摘要 |
PURPOSE:To discriminate the access address of a DRAM in the early stage in the microprocessor having a DRAM multiplex address output function. CONSTITUTION:A microprocessor 2 of an emulator which artificially operates an electronic device as the examination object to debug this electronic device is provided with the function which outputs a multiplex address signal for a DRAM 19 to upper address terminals A19 to A10 of the microprocessor 2. |
申请公布号 |
JPH07152597(A) |
申请公布日期 |
1995.06.16 |
申请号 |
JP19930297656 |
申请日期 |
1993.11.29 |
申请人 |
HITACHI LTD;HITACHI MICOM SYST:KK |
发明人 |
SUZUKI TATSUYA;AOTO GIICHI |
分类号 |
G06F11/22 |
主分类号 |
G06F11/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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