| 摘要 |
PURPOSE: To eliminate a problem of excessive evaluation caused by existence of F by determining a mass ratio of Pu in PuF4 to total Pu content in material containing F by using high resolution γ-ray spectroscopy. CONSTITUTION: A sample 1 containing PuF4 is placed on a Ge crystal axis before a high purity Ge detector 2. A lead collimator 3 is provided on the detector 2, and a thin Cd shield 4 is installed before that. A high voltage power source 5 and a preamplifier power source 6 are connected to the detector 2. An output signal from the detector 2 is transmitted through a spectroamplifier 7 and an A/D converter 8 to a personal computer and a multi-channel analyzer 9. A γ-spectrum of radiation emitted by the sample 1 is collected by the device 9. A relational net photoelectric peak count is determined based on the γ-spectrum by the device 9, and Pu and Am isotope composition is determined using that. A mass ratio of PuF4 to total Pu content is thus determined by a specified program based on this information. |
