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发明名称
TESTING APPARATUS FOR INTEGRATED CIRCUIT
摘要
申请公布号
JPH07151819(A)
申请公布日期
1995.06.16
申请号
JP19930326238
申请日期
1993.11.30
申请人
ANDO ELECTRIC CO LTD
发明人
WATANABE AKIRA
分类号
G01R31/26;G01R31/28;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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