发明名称 Dry etching process for semiconductor
摘要 A process for forming deep trenches on a surface of a semiconductor substrate by forming a mask on the surface of the semiconductor, which prescribes the position of the trenches; and then dry etching the semiconductor surface using a gas mixture comprising (1) an etchant, bromine containing, gas which etches the semiconductor surface to form trenches, (2) a cleaning, halogen containing, gas which evaporates the residue formed by the etching; and (3) a reactive gas capable of reacting with material formed during the etching and capable of decreasing the wastage of the mask by the etchant gas.
申请公布号 US5423941(A) 申请公布日期 1995.06.13
申请号 US19930152896 申请日期 1993.11.17
申请人 NIPPONDENSO CO., LTD. 发明人 KOMURA, ATSUSHI;SAKANO, YOSHIKAZU;KONDO, KENJI;KON, KEIICHI;SANBEI, TETSUHIKO;MIURA, SHOJI
分类号 H01L21/302;H01L21/3065;(IPC1-7):C23F1/00 主分类号 H01L21/302
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