| 摘要 |
Eddy-current response voltages, generated during inspection of metallic structures for anomalies, are often replete with noise. Therefore, analysis of the inspection data and results is difficult or near impossible, resulting in inconsistent or unreliable evaluation of the structure. This invention processes the eddy-current response voltage, removing the effect of random noise, to allow proper identification of anomalies within and associated with the structure.
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