发明名称 Prodn. of a capacitor for semiconductor storage device
摘要 Prodn. of a capacitor comprises: (a) preparing a substrate (11); (b) forming an insulating intermediate layer (12) on the substrate; (c) removing a selected region of the intermediate layer so that a contact hole (13) is formed, through which a required surface region of the substrate, corresp. to a region formed as contact for the capacitor, is partially exposed; (c) burying W in the contact hole where a contact mark (14) is formed; (d) forming a storage electrode (15) on the intermediate layer so that the electrode is in electrical contact with the contact mark; (e) selectively etching the storage electrode up to a required depth so that at least two recesses (16) are formed in the electrode; and (f) forming a dielectric film (17) and a plate electrode (18) on the whole exposed surface and the storage electrode provided with recesses.
申请公布号 DE4442432(A1) 申请公布日期 1995.06.08
申请号 DE19944442432 申请日期 1994.11.29
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYONGGI, KR 发明人 KIM, CHOON HWAN, ICHON, KYONNGI, KR
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L21/8256;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L27/04
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