发明名称 |
Prodn. of a capacitor for semiconductor storage device |
摘要 |
Prodn. of a capacitor comprises: (a) preparing a substrate (11); (b) forming an insulating intermediate layer (12) on the substrate; (c) removing a selected region of the intermediate layer so that a contact hole (13) is formed, through which a required surface region of the substrate, corresp. to a region formed as contact for the capacitor, is partially exposed; (c) burying W in the contact hole where a contact mark (14) is formed; (d) forming a storage electrode (15) on the intermediate layer so that the electrode is in electrical contact with the contact mark; (e) selectively etching the storage electrode up to a required depth so that at least two recesses (16) are formed in the electrode; and (f) forming a dielectric film (17) and a plate electrode (18) on the whole exposed surface and the storage electrode provided with recesses.
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申请公布号 |
DE4442432(A1) |
申请公布日期 |
1995.06.08 |
申请号 |
DE19944442432 |
申请日期 |
1994.11.29 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYONGGI, KR |
发明人 |
KIM, CHOON HWAN, ICHON, KYONNGI, KR |
分类号 |
H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L21/8256;H01L27/108;(IPC1-7):H01L21/824 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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