发明名称 Photomask and method of manufacturing the same
摘要 A first anti-reflection film is inserted between a transparent glass substrate and the light shielding pattern. The first anti-reflection film has a refractive index larger than that of the glass substrate but smaller than that of the light shielding pattern. A second anti-reflection film is formed on the glass substrate between adjacent light shielding patterns. The second anti-reflection film has a refractive index larger than that of air but smaller than that of the glass substrate. Thus, a light beam entering the glass substrate is not reflected at the front surface of the glass substrate regardless of whether the light beam entered in a portion provided with a light shielding pattern.
申请公布号 US5422206(A) 申请公布日期 1995.06.06
申请号 US19940218847 申请日期 1994.03.28
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KAMON, KAZUYA
分类号 G03F1/54;G03F1/68;G03F1/80;H01L21/027;H01L21/30;(IPC1-7):G03F9/00 主分类号 G03F1/54
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