发明名称 Method of forming single crystalline electrical isolated wells
摘要 A quasi-dielectrically isolated (QDI) bipolar structure using epitaxial lateral overgrowth (ELO) uses a combination of dielectric isolation (DI) and junction isolation (JI), providing better isolation properties than JI, while providing better heat dissipation than DI. ELO silicon is grown out of a deep basin with oxide sidewalls for lateral dielectric isolation. The ELO silicon is grown at a low temperature and pressure in an RF heated pancake-type reactor. Fabricated transistors have gains, ideality factors, and leakage currents comparable to bulk devices. A main application for QDI is in power integrated circuits (PICs) where isolation of high power devices and low power logic is necessary.
申请公布号 US5422299(A) 申请公布日期 1995.06.06
申请号 US19930000802 申请日期 1993.01.04
申请人 PURDUE RESEARCH FOUNDATION 发明人 NEUDECK, GEROLD W.;DUEY, STEPHEN J.
分类号 H01L21/762;(IPC1-7):H01L21/302 主分类号 H01L21/762
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