发明名称 Selective formation of porous silicon
摘要 A pattern of porous silicon is produced in the surface of a silicon substrate by forming a pattern of crystal defects in said surface, preferably by applying an ion milling beam through openings in a photoresist layer to the surface, and then exposing said surface to a stain etchant, such as HF:HNO3:H2O. The defected crystal will preferentially etch to form a pattern of porous silicon. When the amorphous content of the porous silicon exceeds 70% the porous silicon pattern emits visible light at room temperature.
申请公布号 US5421958(A) 申请公布日期 1995.06.06
申请号 US19930073019 申请日期 1993.06.07
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF THE UNITED STATES NATIONAL AERONAUTICS AND SPACE ADMINISTRATION 发明人 FATHAUER, ROBERT W.;JONES, ERIC W.
分类号 H01L21/306;(IPC1-7):H01L21/00 主分类号 H01L21/306
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