发明名称 Method of forming semiconductor hetero interfaces
摘要 A method is disclosed of forming semiconductor hetero interfaces that will contribute to the performance improvement of devices having semiconductor hetero interfaces such as MOS transistors, quantum devices, capacitors and the like. The method comprises the steps of making the surface of a semiconductor substrate clean and flat in terms of atomic level by heating said semiconductor substrate in vacuum to a temperature at which reconstruction of the surface atoms of said semiconductor substrate takes place, then forming a structural buffer layer such as a native oxide layer and the like on said semiconductor substrate surface after the temperature of said semiconductor substrate was lowered to room temperature and finally subjecting the semiconductor substrate with said structural buffer layer formed on its surface to a thermal treatment performed in certain specified temperature and atmosphere. Accordingly, the semiconductor substrate surface becomes smooth in terms of atomic level and an ultra smooth semiconductor interface is formed.
申请公布号 US5422306(A) 申请公布日期 1995.06.06
申请号 US19920990702 申请日期 1992.12.15
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NIWA, MASAAKI;UDAGAWA, MASAHARU;HIRAI, YOSHIHIKO;YASUI, JUUROU
分类号 H01L27/04;H01L21/02;H01L21/30;H01L21/302;H01L21/306;H01L21/336;H01L21/822;H01L29/04;H01L29/06;H01L29/12;H01L29/78;(IPC1-7):H01L21/20 主分类号 H01L27/04
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