发明名称 CIRCUIT ELEMENT VALUE ADJUSTMENT CIRCUIT OF SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD
摘要 <p>PURPOSE: To exert no effect on a peripheral circuit at the time of zapping by accurately obtaining a specific target by confirming whether each circuit element value matches a target value, before circuit element values are zapped according to an adjustment signal. CONSTITUTION: A 1st opening/closing part 311 has a switching controller 351 and a switching element S1 . The switching controller 351 inputs a 1st adjustment signal Sz1 through an input terminal 301 , before a zapping control signal Cz is activated and then turned off to confirm whether or not an achieved value matches a target value, when a zapping control signal is activated. After the zapping control signal is activated, the 1st adjustment signal is inputted from a 1st zapping part 321 . Further, the switching element S1 is connected to a 1st resistance R1 in parallel to bash the connected 1st resistance R1 with the output of the switching controller 351 . Consequently, a circuit element can be prevented from deteriorating, without directly applying electric voltages or currents to the circuit element.</p>
申请公布号 JPH07142678(A) 申请公布日期 1995.06.02
申请号 JP19940129292 申请日期 1994.06.10
申请人 SAMSUNG ELECTRON CO LTD 发明人 SHIN EIKOU;RI NOBUHITO
分类号 H01L27/04;H01L21/66;H01L21/82;H01L21/822;H01L27/02;H01L27/08;(IPC1-7):H01L27/04 主分类号 H01L27/04
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