PATTERN GENERATION OF IC TESTER,申请号JP19930307122-传众专利搜索

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发明名称	PATTERN GENERATION OF IC TESTER
摘要
申请公布号	JPH07140211(A)	申请公布日期	1995.06.02
申请号	JP19930307122	申请日期	1993.11.15
申请人	HITACHI ELECTRON ENG CO LTD	发明人	MIYAHARA KUNIHIKO
分类号	G01R31/3183;(IPC1-7):G01R31/318	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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