发明名称 |
FABRICATION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To provide a method for fabricating a semiconductor device in which a metal compound film can be deposited on a semiconductor substrate without increasing the resistivity or deteriorating the heat resistance even in the form of a thin film. CONSTITUTION:The method for fabricating a semiconductor device comprises a step for depositing a transition metal film 6 on a semiconductor substrate 1, a step for depositing a carbon film 7 thereon, and a step for causing at least a part of the semiconductor substrate 1 to react on the transition metal 6 contiguous thereto through heat treatment thus depositing a compound film 8 of the compositional element of the semiconductor substrate and the transition metal. |
申请公布号 |
JPH07142423(A) |
申请公布日期 |
1995.06.02 |
申请号 |
JP19930283677 |
申请日期 |
1993.11.12 |
申请人 |
TOSHIBA CORP |
发明人 |
OUCHI KAZUYA;SUGURO KYOICHI |
分类号 |
H01L21/28;H01L21/324;H01L21/768;H01L23/522;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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